LTX Introduces Fusion EX - the New Benchmark for SOC Test Scalability; Reducing The Cost of Test for Complex, High Volume ICs
WESTWOOD, Mass.—(BUSINESS WIRE)—June 20, 2005—
LTX Corporation (Nasdaq: LTXX), a leading supplier of
semiconductor test solutions, today announced its new Fusion EX. This
new Fusion configuration offers four times as many instrument channels
as the popular Fusion CX, a new functional/structural digital test
channel, and Fusion's proven mixed-signal instruments. Fusion EX meets
the emerging needs for cost-effective testing of highly complex,
high-volume integrated circuits, such as advanced consumer-digital and
baseband communications devices. Key to its ability to test these
types of devices in parallel is its high number of instrument slots,
which also enable massive multisite testing of lower complexity
devices.
Fusion EX is fully outsource-manufactured, and has been ordered by
several customers, with multiple units already delivered.
"After successfully launching Fusion, the industry's first
single-platform SOC tester several years ago, we listened to our
customers and heard them loud and clear - single-platform testers were
their future but one-size doesn't fit every application," commented
Roger W. Blethen, chairman and chief executive officer of LTX. "Today
we announced Fusion EX, our fourth in a series of second generation,
scalable Fusion systems. Based on its quick acceptance by several
customers, including IDMs and fabless IC companies, Fusion EX seems to
have hit the mark."
FUSION EX SCALABLE PERFORMANCE
Fusion EX incorporates 80 universal instrument slots, enabling a
wider range of system configurations. Fusion EX also uses existing
Fusion platform instruments, which are architected with a limited
number of instrument channels per card to provide small configuration
increments. This instrument channel granularity, combined with
Fusion's universal slot design, produces system configurations with a
lower cost of ownership than competitive platforms.
Fusion EX provides full functional test capabilities and the
built-in support necessary for effective structural test, including:
-- Full featured digital performance up to 200MHz, including
embedded memory test, and time measurement per pin
-- Proven SERDES options to 12Gb/s
-- Design for test (DFT) support through independent scan per pin
-- Seamless interface to third-party built-in self test (BIST)
solutions with fully integrated diagnostic support
In addition, Fusion EX utilizes the same, proven mixed signal
instrument set as the Fusion CX and Fusion DX configurations,
including multiple synthesizers and digitizers, and a full suite of DC
and power test options.
Fusion EX also provides program compatibility utilizing LTX's
established enVision device oriented programming environment. Used
across the Fusion platform, enVision provides powerful debug tools,
encapsulation of test objects for easy reuse of test intellectual
property, and transparent multisite to reduce the cost of test.
FUSION EX RELIABILITY
As a second generation Fusion system, Fusion EX offers
unprecedented reliability. LTX has developed a comprehensive, custom
support package for Fusion EX, which takes advantage of the system's
built-in reliability and LTX customer support expertise to maximize
system uptime and performance while minimizing operational costs.
ABOUT LTX
LTX Corporation (Nasdaq: LTXX) is a leading supplier of test
solutions for the global semiconductor industry. Fusion, LTX's
patented, scalable, single-platform test system, uses innovative
technology to provide high performance, cost-effective testing of
system-on-a-chip, mixed signal, RF, digital and analog integrated
circuits. Fusion addresses semiconductor manufacturers' economic and
performance requirements today, while enabling their technology
roadmap of tomorrow. LTX's web site is www.ltx.com.
LTX and Fusion are registered trademarks and enVision is a
trademark of LTX Corporation.
All other trademarks are the property of their respective owners.
Contact:
LTX Corporation
Mark Gallenberger, 781-467-5417
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